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dc.contributor.authorLemmens, Marijn
dc.contributor.authorThoelen, Ronald
dc.contributor.authorDe Raedts, Walter
dc.contributor.authorGrieten, Lars
dc.date.accessioned2021-10-25T21:47:26Z
dc.date.available2021-10-25T21:47:26Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31151
dc.sourceIIOimport
dc.titleCharacterisation of an electrical impedance tomography sensor for imaging cells in culture
dc.typeOral presentation
dc.contributor.imecauthorThoelen, Ronald
dc.contributor.orcidimecThoelen, Ronald::0000-0001-6845-0866
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceInternational Student Colloquium in Functional Layers
dc.source.conferencedate22/11/2018
dc.source.conferencelocationZweibrücken Germany
imec.availabilityPublished - imec


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