Effects of grain boundaries on the electronic properties of MoS2 layers

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Authors
Ludwig, Jonathan; Chiappe, Daniele; Mascaro, Marco; Celano, Umberto; Asselberghs, Inge; Radu, Iuliana; van der Heide, Paul; Vandervorst, Wilfried; Paredis, Kristof
Conference
E-MRS Spring Meeting Symposium K: Defect-induced Effects in Nanomaterials
Title
Effects of grain boundaries on the electronic properties of MoS2 layers
Publication type
Meeting abstract
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