dc.contributor.author | Vos, Rita | |
dc.contributor.author | Lux, Marcel | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Ramage, R. | |
dc.date.accessioned | 2021-10-01T09:41:41Z | |
dc.date.available | 2021-10-01T09:41:41Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3133 | |
dc.source | IIOimport | |
dc.title | Impact of trace metals in lithochemicals | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | Lux, Marcel | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.source.peerreview | no | |
dc.source.conference | 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS | |
dc.source.conferencedate | 21/09/1998 | |
dc.source.conferencelocation | Oostende Belgium | |
imec.availability | Published - imec | |
imec.internalnotes | Publ. in 1999; Zie C3983 | |