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Exploiting energy sequencing of low energy SIMS to determine intrinsic chemical profiles with sub-nm precision
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Authors
Morris, Richard
;
Hase, Thomas
ISSN
1071-1023
Issue
3
Journal
Journal of Vacuum Science and Technology B
Volume
36
Title
Exploiting energy sequencing of low energy SIMS to determine intrinsic chemical profiles with sub-nm precision
Publication type
Journal article
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