Show simple item record

Nanoscale stress measurements using Raman spectroscopy

dc.contributor.authorNuytten, Thomas
dc.date.accessioned2021-10-26T00:16:27Z
dc.date.available2021-10-26T00:16:27Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31432
dc.sourceIIOimport
dc.titleNanoscale stress measurements using Raman spectroscopy
dc.typeProceedings paper
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.source.peerreviewyes
dc.source.conference7th Center for Applied Microstructure (CAM) Diagnostics Workshop
dc.source.conferencedate25/04/2018
dc.source.conferencelocationHalle Germany
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record