dc.contributor.author | Pandey, Komal | |
dc.contributor.author | Paredis, Kristof | |
dc.contributor.author | Drijbooms, Chris | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Bender, Hugo | |
dc.date.accessioned | 2021-10-26T00:40:01Z | |
dc.date.available | 2021-10-26T00:40:01Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31473 | |
dc.source | IIOimport | |
dc.title | The impact of Focused Ion Beam (FIB) induced electrical damage on electrical characterization | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Pandey, Komal | |
dc.contributor.imecauthor | Paredis, Kristof | |
dc.contributor.imecauthor | Drijbooms, Chris | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.orcidimec | Paredis, Kristof::0000-0002-5163-4164 | |
dc.source.peerreview | no | |
dc.source.beginpage | I.15.2 | |
dc.source.conference | European Materials Research Society Spring Meeting Symposium I: Materials Research for Group IV Semiconductors: Growth, Characte | |
dc.source.conferencedate | 18/06/2018 | |
dc.source.conferencelocation | Strasbourg France | |
imec.availability | Published - imec | |