Show simple item record

Scanning probe microscopy for future semiconductor devices

dc.contributor.authorParedis, Kristof
dc.date.accessioned2021-10-26T00:48:09Z
dc.date.available2021-10-26T00:48:09Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31486
dc.sourceIIOimport
dc.titleScanning probe microscopy for future semiconductor devices
dc.typeOral presentation
dc.contributor.imecauthorParedis, Kristof
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewno
dc.source.conference2018 NanoScientific Forum Europe
dc.source.conferencedate10/10/2018
dc.source.conferencelocationFreiberg Germany
dc.identifier.urlhttps://www.parksystems.com/images/events/symposium/NSFE_Program_short.pdf
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record