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Scaling CMOS beyond Si FinFET: an analog/RF perspective

dc.contributor.authorParvais, Bertrand
dc.contributor.authorHellings, Geert
dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorMitard, Jerome
dc.contributor.authorJang, Doyoung
dc.contributor.authorDeshpande, Veeresh Vidyadhar
dc.contributor.authorvan Liempd, Barend
dc.contributor.authorVeloso, Anabela
dc.contributor.authorVandooren, Anne
dc.contributor.authorWaldron, Niamh
dc.contributor.authorWambacq, Piet
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVerkest, Diederik
dc.date.accessioned2021-10-26T00:52:05Z
dc.date.available2021-10-26T00:52:05Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31493
dc.sourceIIOimport
dc.titleScaling CMOS beyond Si FinFET: an analog/RF perspective
dc.typeProceedings paper
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorvan Liempd, Barend
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecvan Liempd, Barend::0000-0001-6877-8116
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage158
dc.source.endpage161
dc.source.conference48th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate3/09/2018
dc.source.conferencelocationDresden Germany
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8486857
imec.availabilityPublished - open access


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