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NanoStreeM to assess exposure and risks of nanomaterials in nano-electronics manufacturing with generig nano risk assessment tools

dc.contributor.authorProdanov, Dimiter
dc.date.accessioned2021-10-26T01:37:32Z
dc.date.available2021-10-26T01:37:32Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31569
dc.sourceIIOimport
dc.titleNanoStreeM to assess exposure and risks of nanomaterials in nano-electronics manufacturing with generig nano risk assessment tools
dc.typeProceedings paper
dc.contributor.imecauthorProdanov, Dimiter
dc.contributor.orcidimecProdanov, Dimiter::0000-0001-8694-0535
dc.source.peerreviewyes
dc.source.beginpage67
dc.source.conferenceNanoSafe 2018
dc.source.conferencedate5/11/2018
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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