The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown

Metadata

Show full item record

Authors

Rackauskas, Ben; J. Uren, Michael; Stoffels, Steve; Zhao, Ming; Bakeroot, Benoit; Decoutere, Stefaan; Kuball, Martin

ISSN

0741-3106

Issue

10

Journal

IEEE Electron Device Letters

Volume

39

Title

The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown

Publication type

Journal article

Collections

Articles