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On the key impact of composition of Ge-Te and Ge-Se electrolytes on CBRAM properties

dc.contributor.authorRadhakrishnan, Janaki
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorWitters, Thomas
dc.contributor.authorClima, Sergiu
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorHoussa, Michel
dc.contributor.authorGoux, Ludovic
dc.date.accessioned2021-10-26T01:47:26Z
dc.date.available2021-10-26T01:47:26Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31586
dc.sourceIIOimport
dc.titleOn the key impact of composition of Ge-Te and Ge-Se electrolytes on CBRAM properties
dc.typeProceedings paper
dc.contributor.imecauthorRadhakrishnan, Janaki
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorWitters, Thomas
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceIEEE International Memory Workshop - IMW
dc.source.conferencedate14/05/2018
dc.source.conferencelocationKyoto Japan
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8388842
imec.availabilityPublished - open access


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