dc.contributor.author | Ramon, Hannes | |
dc.contributor.author | Lambrecht, Joris | |
dc.contributor.author | Verbist, Jochem | |
dc.contributor.author | Vanhoecke, Michael | |
dc.contributor.author | Srinivasan, Ashwyn | |
dc.contributor.author | De Heyn, Peter | |
dc.contributor.author | Van Campenhout, Joris | |
dc.contributor.author | Ossieur, Peter | |
dc.contributor.author | Yin, Xin | |
dc.contributor.author | Bauwelinck, Johan | |
dc.date.accessioned | 2021-10-26T02:05:37Z | |
dc.date.available | 2021-10-26T02:05:37Z | |
dc.date.issued | 2018-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31615 | |
dc.source | IIOimport | |
dc.title | 70 Gb/s 0.87 pJ/bit GeSi EAM driver in 55 nm SiGe BiCMOS | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ramon, Hannes | |
dc.contributor.imecauthor | Lambrecht, Joris | |
dc.contributor.imecauthor | Vanhoecke, Michael | |
dc.contributor.imecauthor | Srinivasan, Ashwyn | |
dc.contributor.imecauthor | De Heyn, Peter | |
dc.contributor.imecauthor | Van Campenhout, Joris | |
dc.contributor.imecauthor | Ossieur, Peter | |
dc.contributor.imecauthor | Yin, Xin | |
dc.contributor.imecauthor | Bauwelinck, Johan | |
dc.contributor.orcidimec | Lambrecht, Joris::0000-0001-8291-0339 | |
dc.contributor.orcidimec | Vanhoecke, Michael::0000-0002-5472-6339 | |
dc.contributor.orcidimec | De Heyn, Peter::0000-0003-3523-7377 | |
dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
dc.contributor.orcidimec | Ossieur, Peter::0000-0002-8737-9142 | |
dc.contributor.orcidimec | Yin, Xin::0000-0002-9672-6652 | |
dc.contributor.orcidimec | Bauwelinck, Johan::0000-0001-5254-2408 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 3 | |
dc.source.conference | 44th European Conference on Optical Communications - ECOC | |
dc.source.conferencedate | 23/09/2018 | |
dc.source.conferencelocation | Roma Italy | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8535467 | |
imec.availability | Published - open access | |