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Automated probe mark analysis

dc.contributor.authorRong, Yu-Rong
dc.contributor.authorWu, Cheng-Wen
dc.contributor.authorFodor, Ferenc
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-26T02:49:04Z
dc.date.available2021-10-26T02:49:04Z
dc.date.issued2018-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31682
dc.sourceIIOimport
dc.titleAutomated probe mark analysis
dc.typeProceedings paper
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.conferenceSemiconductor Wafer Test Workshop - SWTW
dc.source.conferencedate3/06/2018
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://www.swtest.org/swtw_library/2018proc/PDF/S08_02_Jian_SWTW2018.pdf
imec.availabilityPublished - imec


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