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New methodology for modelling MOL TDDB coping with variability

dc.contributor.authorRoussel, Philippe
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorDemuynck, Steven
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-26T02:51:25Z
dc.date.available2021-10-26T02:51:25Z
dc.date.issued2018-03
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31686
dc.sourceIIOimport
dc.titleNew methodology for modelling MOL TDDB coping with variability
dc.typeProceedings paper
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorDemuynck, Steven
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.conference2018 IEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8353555
imec.availabilityPublished - imec


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