dc.contributor.author | Ryckaert, Julien | |
dc.contributor.author | Schuddinck, Pieter | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Bouche, Guillaume | |
dc.contributor.author | Vincent, Benjamin | |
dc.contributor.author | Smith, J. | |
dc.contributor.author | Sherazi, Yasser | |
dc.contributor.author | Mallik, Arindam | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Demuynck, Steven | |
dc.contributor.author | Huynh Bao, Trong | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Mocuta, Anda | |
dc.contributor.author | Mocuta, Dan | |
dc.contributor.author | Boemmels, Juergen | |
dc.date.accessioned | 2021-10-26T02:56:38Z | |
dc.date.available | 2021-10-26T02:56:38Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31694 | |
dc.source | IIOimport | |
dc.title | The complementary FET (CFET) for CMOS scaling beyond N3 | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ryckaert, Julien | |
dc.contributor.imecauthor | Schuddinck, Pieter | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Vincent, Benjamin | |
dc.contributor.imecauthor | Sherazi, Yasser | |
dc.contributor.imecauthor | Mallik, Arindam | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Demuynck, Steven | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Boemmels, Juergen | |
dc.contributor.orcidimec | Mallik, Arindam::0000-0002-0742-9366 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 141 | |
dc.source.endpage | 142 | |
dc.source.conference | IEEE Symposium on VLSI Technology | |
dc.source.conferencedate | 18/06/2018 | |
dc.source.conferencelocation | Honolulu, HI USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8510618 | |
imec.availability | Published - open access | |