Show simple item record

Sensitivity study of the parasitics of advanced finFETs

dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorIverson, Ralph
dc.contributor.authorAnnamalai, Senthil
dc.contributor.authorYakimets, Dmitry
dc.contributor.authorParvais, Bertrand
dc.contributor.authorSundaresan, Krishnakumar
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-26T03:30:45Z
dc.date.available2021-10-26T03:30:45Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31746
dc.sourceIIOimport
dc.titleSensitivity study of the parasitics of advanced finFETs
dc.typeMeeting abstract
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecSchuddinck, Pieter::0000-0003-1893-3135
dc.contributor.orcidimecYakimets, Dmitry::0000-0002-0772-7398
dc.source.peerreviewno
dc.source.conferenceSNUG (Synopsys User Group) Europe 2018
dc.source.conferencedate11/06/2018
dc.source.conferencelocationMünchen Germany
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record