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Beyond generic lifecycles: Reusable modeling of custom-fit management workflows for cloud applications

dc.contributor.authorSebrechts, Merlijn
dc.contributor.authorJohns, C.
dc.contributor.authorVan Seghbroeck, Gregory
dc.contributor.authorWauters, Tim
dc.contributor.authorVolckaert, Bruno
dc.contributor.authorDe Turck, Filip
dc.date.accessioned2021-10-26T03:36:31Z
dc.date.available2021-10-26T03:36:31Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31755
dc.sourceIIOimport
dc.titleBeyond generic lifecycles: Reusable modeling of custom-fit management workflows for cloud applications
dc.typeProceedings paper
dc.contributor.imecauthorSebrechts, Merlijn
dc.contributor.imecauthorVan Seghbroeck, Gregory
dc.contributor.imecauthorWauters, Tim
dc.contributor.imecauthorVolckaert, Bruno
dc.contributor.imecauthorDe Turck, Filip
dc.contributor.orcidimecSebrechts, Merlijn::0000-0002-4093-7338
dc.contributor.orcidimecVan Seghbroeck, Gregory::0000-0001-9459-7407
dc.contributor.orcidimecWauters, Tim::0000-0003-2618-3311
dc.contributor.orcidimecVolckaert, Bruno::0000-0003-0575-5894
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage326
dc.source.endpage333
dc.source.conferenceCLOUD2018, IEEE International Conference on Cloud Computing
dc.source.conferencedate2/07/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8457816
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-7235-8


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