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Optical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer

dc.contributor.authorShi, Yuting
dc.contributor.authorKunert, Bernardette
dc.contributor.authorBaryshnikova, Marina
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorVan Thourhout, Dries
dc.date.accessioned2021-10-26T03:44:03Z
dc.date.available2021-10-26T03:44:03Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31767
dc.sourceIIOimport
dc.titleOptical gain characterization of nano-ridge amplifiers epitaxially on a standard si wafer
dc.typeProceedings paper
dc.contributor.imecauthorShi, Yuting
dc.contributor.imecauthorKunert, Bernardette
dc.contributor.imecauthorBaryshnikova, Marina
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.orcidimecKunert, Bernardette::0000-0002-8986-4109
dc.contributor.orcidimecBaryshnikova, Marina::0000-0002-5945-4459
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageJTu2A.21
dc.source.conferenceConference on Lasers and Electro-OPtics - CLEO
dc.source.conferencedate13/05/2018
dc.source.conferencelocationSan Jose, CA USA
dc.identifier.urlhttps://www.osapublishing.org/abstract.cfm?uri=CLEO_AT-2018-JTu2A.21
imec.availabilityPublished - open access
imec.internalnotes


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