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Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2

dc.contributor.authorSimoen, Eddy
dc.contributor.authorHellings, Geert
dc.contributor.authorParvais, Bertrand
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorDekkers, Harold
dc.contributor.authorSchram, Tom
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-26T03:54:43Z
dc.date.available2021-10-26T03:54:43Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31784
dc.sourceIIOimport
dc.titleLow-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.source.peerreviewyes
dc.source.conferenceChina Semiconductor technology International Conference - CSTIC
dc.source.conferencedate11/03/2018
dc.source.conferencelocationShanghai China
imec.availabilityPublished - imec
imec.internalnotesSymposium VI: Metrology, Reliability and Testing


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