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Impact of defects on transport in nanodevices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorHsu, Brent
dc.contributor.authorBoudier, Dimitri
dc.contributor.authorCretu, Bogdan
dc.contributor.authorEneman, Geert
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-26T03:55:23Z
dc.date.available2021-10-26T03:55:23Z
dc.date.issued2018-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31785
dc.sourceIIOimport
dc.titleImpact of defects on transport in nanodevices
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHsu, Brent
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHsu, Brent::0000-0003-0823-6088
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.beginpageG.8.6
dc.source.conferenceE-MRS Spring Meeting Symposium G: Carrier Transport, Photonics and Sensing in Group IV-based and Other Semiconductors ...
dc.source.conferencedate18/06/2018
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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