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Cost effective FinFET platform for stand alone DRAM 1Y and beyond memory periphery

dc.contributor.authorSpessot, Alessio
dc.contributor.authorSharan, Neha
dc.contributor.authorOh, Hyungrock
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorDentoni Litta, Eugenio
dc.contributor.authorMallik, Arindam
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorParvais, Bertrand
dc.contributor.authorSherazi, Yasser
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorKim, Cheolgyu
dc.contributor.authorFazan, Pierre
dc.contributor.authorMocuta, Dan
dc.contributor.authorMocuta, Anda
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-26T04:29:56Z
dc.date.available2021-10-26T04:29:56Z
dc.date.issued2018-01
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31838
dc.sourceIIOimport
dc.titleCost effective FinFET platform for stand alone DRAM 1Y and beyond memory periphery
dc.typeProceedings paper
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorSharan, Neha
dc.contributor.imecauthorOh, Hyungrock
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorDentoni Litta, Eugenio
dc.contributor.imecauthorMallik, Arindam
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorSherazi, Yasser
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.imecauthorFazan, Pierre
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecOh, Hyungrock::0000-0001-5244-5755
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecMallik, Arindam::0000-0002-0742-9366
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference2018 IEEE International Memory Workshop (IMW)
dc.source.conferencedate13/05/2018
dc.source.conferencelocationKyoto Japan
dc.identifier.urlhttps://ieeexplore.ieee.org/abstract/document/8388823
imec.availabilityPublished - open access


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