dc.contributor.author | Amokrane, A. | |
dc.contributor.author | Dassonneville, S. | |
dc.contributor.author | Sieber, B. | |
dc.contributor.author | Jacobs, Koen | |
dc.contributor.author | Bougrioua, Zahia | |
dc.contributor.author | Moerman, Ingrid | |
dc.date.accessioned | 2021-10-06T10:40:56Z | |
dc.date.available | 2021-10-06T10:40:56Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3183 | |
dc.source | IIOimport | |
dc.title | Microscale luminescence of ELOG specimens on (0001) sapphire | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Moerman, Ingrid | |
dc.contributor.orcidimec | Moerman, Ingrid::0000-0003-2377-3674 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 345 | |
dc.source.endpage | 348 | |
dc.source.conference | Microscopy of Semiconducting Materials | |
dc.source.conferencedate | 22/03/1999 | |
dc.source.conferencelocation | Oxford UK | |
imec.availability | Published - open access | |
imec.internalnotes | Institute of Physics Conference Proceedings; Vol.164 | |