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Anomalous C-V inversion in TSV's: The problem and its cure

dc.contributor.authorStucchi, Michele
dc.contributor.authorDe Vos, Joeri
dc.contributor.authorJourdain, Anne
dc.contributor.authorLi, Yunlong
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorCroes, Kristof
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-26T04:53:26Z
dc.date.available2021-10-26T04:53:26Z
dc.date.issued2018
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31874
dc.sourceIIOimport
dc.titleAnomalous C-V inversion in TSV's: The problem and its cure
dc.typeJournal article
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorDe Vos, Joeri
dc.contributor.imecauthorJourdain, Anne
dc.contributor.imecauthorLi, Yunlong
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecDe Vos, Joeri::0000-0002-9332-9336
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecJourdain, Anne::0000-0002-7610-0513
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1473
dc.source.endpage1479
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue4
dc.source.volume65
dc.identifier.urlhttp://www.ieeeexplore.ws/document/8295166/
imec.availabilityPublished - imec


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