Show simple item record

Impact of the device geometric parameters on hot-carrier degradation in FinFETs

dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorMakarov, Alexander
dc.contributor.authorKaczer, Ben
dc.contributor.authorJech, Markus
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorGrill, Alexander
dc.contributor.authorHellings, Geert
dc.contributor.authorVexler, Mikhail
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-26T06:07:26Z
dc.date.available2021-10-26T06:07:26Z
dc.date.issued2018
dc.identifier.issn1063-7826
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31987
dc.sourceIIOimport
dc.titleImpact of the device geometric parameters on hot-carrier degradation in FinFETs
dc.typeJournal article
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1738
dc.source.endpage1742
dc.source.journalSemiconductors
dc.source.issue13
dc.source.volume52
dc.identifier.urlhttps://link.springer.com/article/10.1134/S1063782618130183
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
40692.pdf
Size:
545.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record