dc.contributor.author | Van Beek, Simon | |
dc.date.accessioned | 2021-10-26T06:20:22Z | |
dc.date.available | 2021-10-26T06:20:22Z | |
dc.date.issued | 2018-08 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32006 | |
dc.source | IIOimport | |
dc.title | Reliability characterization of STT-MRAM magnetic memory : The impact of self-heating | |
dc.type | PHD thesis | |
dc.contributor.imecauthor | Van Beek, Simon | |
dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.contributor.thesisadvisor | Groeseneken, Guido | |
dc.identifier.url | https://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS1988601&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1 | |
imec.availability | Published - open access | |