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Reliability characterization of STT-MRAM magnetic memory : The impact of self-heating
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Reliability characterization of STT-MRAM magnetic memory : The impact of self-heating
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Date
2018-08
Dissertation
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43149.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Beek, Simon
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Abstract
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2041
since deposited on 2021-10-26
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Acq. date: 2025-12-16
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Metrics
Views
2041
since deposited on 2021-10-26
3
last month
Acq. date: 2025-12-16
Citations