Publication:

Reliability characterization of STT-MRAM magnetic memory : The impact of self-heating

Date

2018-08
Dissertation
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dc.contributor.authorVan Beek, Simon
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.thesisadvisorGroeseneken, Guido
dc.date.accessioned2021-10-26T06:20:22Z
dc.date.available2021-10-26T06:20:22Z
dc.date.embargo9999-12-31
dc.date.issued2018-08
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32006
dc.identifier.urlhttps://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS1988601&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1
dc.title

Reliability characterization of STT-MRAM magnetic memory : The impact of self-heating

dc.typePHD thesis
dspace.entity.typePublication
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