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Automatic generation of in-circuit tests for board assembly Defects

dc.contributor.authorvan Schaaijk, Harm
dc.contributor.authorSpierings, Martien
dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-26T07:27:04Z
dc.date.available2021-10-26T07:27:04Z
dc.date.issued2018-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32104
dc.sourceIIOimport
dc.titleAutomatic generation of in-circuit tests for board assembly Defects
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage2
dc.source.conferenceIEEE 23rd European Test Symposium - ETS'18
dc.source.conferencedate29/05/2018
dc.source.conferencelocationBremen Germany
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8400714/
imec.availabilityPublished - imec


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