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Automatic generation of in-circuit tests for board assembly defects
Publication:
Automatic generation of in-circuit tests for board assembly defects
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Date
2018-08
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van Schaaijk, Harm
;
Spierings, Martien
;
Marinissen, Erik Jan
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1872
since deposited on 2021-10-26
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Acq. date: 2025-12-18
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Metrics
Views
1872
since deposited on 2021-10-26
1
last month
Acq. date: 2025-12-18
Citations