Authors

Van Waes, Jonas; Lannoo, Jonas; Vankeirsbilck, Jens; Degraeve, Andy; Peuteman, Joan; Vanoost, Dries; Pissoort, Davy; Boydens, Jeroen

Conference

EMC Europe 2018, IEEE International Symposium on Electromagnetic Compatibility

Title

Effectiveness of hamming single error correction codes under harsh eectromagnetic disturbances

Publication type

Proceedings paper

Embargo date

9999-12-31