Show simple item record

Integrated silicon-on-insulator AWG spectrometer with single pixel readout for 2.3 μm spectroscopy applications

dc.contributor.authorVasiliev, Anton
dc.contributor.authorMuneeb, Muhammad
dc.contributor.authorAllaert, Jeroen
dc.contributor.authorBaets, Roel
dc.contributor.authorRoelkens, Gunther
dc.date.accessioned2021-10-26T08:07:21Z
dc.date.available2021-10-26T08:07:21Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32161
dc.sourceIIOimport
dc.titleIntegrated silicon-on-insulator AWG spectrometer with single pixel readout for 2.3 μm spectroscopy applications
dc.typeProceedings paper
dc.contributor.imecauthorVasiliev, Anton
dc.contributor.imecauthorMuneeb, Muhammad
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecVasiliev, Anton::0000-0002-7712-2183
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageWe.2.B.4
dc.source.conferenceEuropean Conference on Integrated Optics - ECIO
dc.source.conferencedate30/05/2018
dc.source.conferencelocationValencia Spain
imec.availabilityPublished - imec


Files in this item

Thumbnail
Name:
39376.pdf
Size:
289.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record