dc.contributor.author | Wan, Danny | |
dc.contributor.author | Paolillo, Sara | |
dc.contributor.author | Rassoul, Nouredine | |
dc.contributor.author | Kutrzeba Kotowska, Bogumila | |
dc.contributor.author | Blanco, Victor | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Lazzarino, Frederic | |
dc.contributor.author | Ercken, Monique | |
dc.contributor.author | Murdoch, Gayle | |
dc.contributor.author | Boemmels, Juergen | |
dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Tokei, Zsolt | |
dc.date.accessioned | 2021-10-26T09:05:10Z | |
dc.date.available | 2021-10-26T09:05:10Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32240 | |
dc.source | IIOimport | |
dc.title | Subtractive etch of ruthenium for sub-5nm interconnect | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wan, Danny | |
dc.contributor.imecauthor | Paolillo, Sara | |
dc.contributor.imecauthor | Rassoul, Nouredine | |
dc.contributor.imecauthor | Kutrzeba Kotowska, Bogumila | |
dc.contributor.imecauthor | Blanco, Victor | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Lazzarino, Frederic | |
dc.contributor.imecauthor | Ercken, Monique | |
dc.contributor.imecauthor | Murdoch, Gayle | |
dc.contributor.imecauthor | Boemmels, Juergen | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.orcidimec | Wan, Danny::0000-0003-4847-3184 | |
dc.contributor.orcidimec | Rassoul, Nouredine::0000-0001-9489-3396 | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.contributor.orcidimec | Lazzarino, Frederic::0000-0001-7961-9727 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 10 | |
dc.source.endpage | 12 | |
dc.source.conference | IEEE International Interconnect Technology Conference - IITC | |
dc.source.conferencedate | 4/06/2018 | |
dc.source.conferencelocation | Santa Clara, CA USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8454841 | |
imec.availability | Published - open access | |