dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2021-10-26T09:39:16Z | |
dc.date.available | 2021-10-26T09:39:16Z | |
dc.date.issued | 2018-11 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32286 | |
dc.source | IIOimport | |
dc.title | Electrical modeling of STT-MRAM defects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 10 | |
dc.source.conference | IEEE International Test Conference - ITC | |
dc.source.conferencedate | 28/10/2018 | |
dc.source.conferencelocation | Phoenix, AZ USA | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8624749 | |
imec.availability | Published - open access | |