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Electrical modeling of STT-MRAM defects

dc.contributor.authorWu, Lizhou
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorRao, Siddharth
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorHamdioui, Said
dc.date.accessioned2021-10-26T09:39:16Z
dc.date.available2021-10-26T09:39:16Z
dc.date.issued2018-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32286
dc.sourceIIOimport
dc.titleElectrical modeling of STT-MRAM defects
dc.typeProceedings paper
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage10
dc.source.conferenceIEEE International Test Conference - ITC
dc.source.conferencedate28/10/2018
dc.source.conferencelocationPhoenix, AZ USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8624749
imec.availabilityPublished - open access


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