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Perturbative statistical assessment of PCB differential interconnects

dc.contributor.authorWu, X.
dc.contributor.authorFrassi, F.
dc.contributor.authorManfredi, P.
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-26T09:39:57Z
dc.date.available2021-10-26T09:39:57Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32287
dc.sourceIIOimport
dc.titlePerturbative statistical assessment of PCB differential interconnects
dc.typeProceedings paper
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceIEEE 22nd Workshop on Signal and Power Integrity (SPI)
dc.source.conferencedate22/05/2018
dc.source.conferencelocationBrest France
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8401678
imec.availabilityPublished - imec


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