Show simple item record

Circuit interpretation and perturbative analysis of differential-to-common mode conversion due to bend discontinuities

dc.contributor.authorWu, X.
dc.contributor.authorGrassi, F.
dc.contributor.authorPignari, S.A.
dc.contributor.authorManfredi, Paolo
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-26T09:43:24Z
dc.date.available2021-10-26T09:43:24Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32292
dc.sourceIIOimport
dc.titleCircuit interpretation and perturbative analysis of differential-to-common mode conversion due to bend discontinuities
dc.typeProceedings paper
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conferenceIEEE Electrical Design of Advanced Packaging and Systems Symposium - EDAPS
dc.source.conferencedate14/12/2017
dc.source.conferencelocationHangzhou China
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8276966/
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-1237-8


Files in this item

Thumbnail
Name:
38434.pdf
Size:
482.5Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record