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From parameter extraction, variability models to yield prediction

dc.contributor.authorXing, Yufei
dc.contributor.authorDong, Jiaxing
dc.contributor.authorKhan, Muhammad Umar
dc.contributor.authorYe, Yinghao
dc.contributor.authorSpina, Domenico
dc.contributor.authorDhaene, Tom
dc.contributor.authorBogaerts, Wim
dc.date.accessioned2021-10-26T09:50:09Z
dc.date.available2021-10-26T09:50:09Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32301
dc.sourceIIOimport
dc.titleFrom parameter extraction, variability models to yield prediction
dc.typeProceedings paper
dc.contributor.imecauthorKhan, Muhammad Umar
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.orcidimecKhan, Muhammad Umar::0000-0001-5760-7485
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageW3E.1
dc.source.conferenceLatin America Optics and Photonics
dc.source.conferencedate12/11/2018
dc.source.conferencelocationLima Peru
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-943580-49-1


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