Publication:

Combined STEM-EDS tomography of nanowire structures

Date

2019

Journal article

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Author(s)

;

Richard, Olivier

;

Kundu, Paromita

;

;

;

Palenstijn, Willem Jan

;

Batenburg, Kees Joost

;

;

;

Schoenmakers, Remco

Journal

Semiconductor Science and Technology

Metrics

1848 since deposited on 2021-10-27

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Acq. date: 2026-01-07