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Fluctuation scaling in nano-interconnects and its application to electromigration

dc.contributor.authorBeyne, Sofie
dc.contributor.authorBeyne, Tim
dc.date.accessioned2021-10-27T07:33:55Z
dc.date.available2021-10-27T07:33:55Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32535
dc.sourceIIOimport
dc.titleFluctuation scaling in nano-interconnects and its application to electromigration
dc.typeMeeting abstract
dc.contributor.imecauthorBeyne, Sofie
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceInternational Conference on Noise and Fluctuations (ICNF)
dc.source.conferencedate18/06/2019
dc.source.conferencelocationNeuchatel Switzerland
dc.identifier.urlhttps://infoscience.epfl.ch/record/269229?ln=en
imec.availabilityPublished - open access


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