A novel electromigration characterization method based on low-frequency noise measurements

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Authors

Beyne, Sofie; Varela Pedreira, Olalla; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof

ISSN

0268-1242

Issue

7

Journal

Semiconductor Science and Technology

Volume

34

Title

A novel electromigration characterization method based on low-frequency noise measurements

Publication type

Journal article

Embargo date

9999-12-31

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