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Reliability of magnetic tunnel-junctions

dc.contributor.authorBoeve, Hans
dc.contributor.authorOepts, W.
dc.contributor.authorGirgis, E.
dc.contributor.authorSchelten, J.
dc.contributor.authorCoehoorn, R.
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-06T10:44:11Z
dc.date.available2021-10-06T10:44:11Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3253
dc.sourceIIOimport
dc.titleReliability of magnetic tunnel-junctions
dc.typeProceedings paper
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorBorghs, Gustaaf
dc.source.peerreviewno
dc.source.beginpage276
dc.source.endpage279
dc.source.conferenceESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
imec.availabilityPublished - imec


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