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Experimental calibration of the temperature dependence of the heterojunction bandgap in III-V tunneling devices

dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorVerhulst, Anne
dc.contributor.authorSmets, Quentin
dc.contributor.authorSoree, Bart
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-27T07:37:01Z
dc.date.available2021-10-27T07:37:01Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32561
dc.sourceIIOimport
dc.titleExperimental calibration of the temperature dependence of the heterojunction bandgap in III-V tunneling devices
dc.typeProceedings paper
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.source.peerreviewyes
dc.source.conference77th Device Research Conference (DRC)
dc.source.conferencedate23/06/2019
dc.source.conferencelocationAnn Arbor, MI USA
imec.availabilityPublished - imec


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