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Hedgehog probe tips enabling high-resolution scanning probe microscopy

dc.contributor.authorBoehme, Thijs
dc.contributor.authorHantschel, Thomas
dc.contributor.authorWouters, Lennaert
dc.contributor.authorFolkersma, Steven
dc.contributor.authorParedis, Kristof
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-27T07:38:42Z
dc.date.available2021-10-27T07:38:42Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32574
dc.sourceIIOimport
dc.titleHedgehog probe tips enabling high-resolution scanning probe microscopy
dc.typeMeeting abstract
dc.contributor.imecauthorBoehme, Thijs
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorFolkersma, Steven
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.source.peerreviewyes
dc.source.conference21st International Scanning Probe Microscopy (ISPM) Conference
dc.source.conferencedate26/05/2019
dc.source.conferencelocationLouvain-La-Neuve Belgium
imec.availabilityPublished - imec


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