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Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits

dc.contributor.authorBogaerts, Wim
dc.contributor.authorXing, Yufei
dc.contributor.authorKhan, Muhammad Umar
dc.date.accessioned2021-10-27T07:39:42Z
dc.date.available2021-10-27T07:39:42Z
dc.date.issued2019
dc.identifier.issn1077-260X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32581
dc.sourceIIOimport
dc.titleLayout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits
dc.typeJournal article
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.imecauthorKhan, Muhammad Umar
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.contributor.orcidimecKhan, Muhammad Umar::0000-0001-5760-7485
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage6100413
dc.source.journalIEEE Journal of Selected Topics in Quantum Electronics
dc.source.issue5
dc.source.volume25
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8675367
imec.availabilityPublished - open access
imec.internalnotes


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