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Articles
Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits
Publication:
Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits
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Date
2019
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogaerts, Wim
;
Xing, Yufei
;
Khan, Muhammad Umar
Journal
IEEE Journal of Selected Topics in Quantum Electronics
Abstract
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1941
since deposited on 2021-10-27
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Acq. date: 2026-01-09
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Metrics
Views
1941
since deposited on 2021-10-27
1
last month
Acq. date: 2026-01-09
Citations