Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits

dc.contributor.author	Bogaerts, Wim
dc.contributor.author	Xing, Yufei
dc.contributor.author	Khan, Muhammad Umar
dc.contributor.imecauthor	Bogaerts, Wim
dc.contributor.imecauthor	Khan, Muhammad Umar
dc.contributor.orcidimec	Bogaerts, Wim::0000-0003-1112-8950
dc.contributor.orcidimec	Khan, Muhammad Umar::0000-0001-5760-7485
dc.date.accessioned	2021-10-27T07:39:42Z
dc.date.available	2021-10-27T07:39:42Z
dc.date.embargo	9999-12-31
dc.date.issued	2019
dc.identifier.issn	1077-260X
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32581
dc.identifier.url	https://ieeexplore.ieee.org/document/8675367
dc.source.beginpage	6100413
dc.source.issue	5
dc.source.journal	IEEE Journal of Selected Topics in Quantum Electronics
dc.source.volume	25
dc.title	Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits
dc.type	Journal article
dspace.entity.type	Publication
Files	Original bundle Name: 42653.pdf Size: 8.11 MB Format: Adobe Portable Document Format Download
Publication available in collections:	Articles