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Impact of fin height on bias temperature instability of memory periphery FinFETs

dc.contributor.authorBoubaaya, Mohamed
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorFranco, Jacopo
dc.contributor.authorDentoni Litta, Eugenio
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorDupuy, Emmanuel
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorFazan, Pierre
dc.contributor.authorCheolgyu Kim, Cheolgyu
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-27T07:42:44Z
dc.date.available2021-10-27T07:42:44Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32602
dc.sourceIIOimport
dc.titleImpact of fin height on bias temperature instability of memory periphery FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorBoubaaya, Mohamed
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorDentoni Litta, Eugenio
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorDupuy, Emmanuel
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.imecauthorFazan, Pierre
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecDupuy, Emmanuel::0000-0003-3341-1618
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage5
dc.source.conference2019 IEEE International Integrated Reliability Workshop (IIRW)
dc.source.conferencedate13/10/2019
dc.source.conferencelocationSouth Lake Tahoe, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8989914
imec.availabilityPublished - imec


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