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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs

dc.contributor.authorBoudier, Dimitri
dc.contributor.authorCretu, Bogdan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHellings, Geert
dc.contributor.authorSchram, Tom
dc.contributor.authorMertens, Hans
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-27T07:42:54Z
dc.date.available2021-10-27T07:42:54Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32603
dc.sourceIIOimport
dc.titleLow frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.conference2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
dc.source.conferencedate1/04/2019
dc.source.conferencelocationGrenoble France
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9041918
imec.availabilityPublished - imec


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