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Ferroelectricity in binary oxides as studied by electrical scanning probe techniques

dc.contributor.authorCelano, Umberto
dc.date.accessioned2021-10-27T07:53:36Z
dc.date.available2021-10-27T07:53:36Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32663
dc.sourceIIOimport
dc.titleFerroelectricity in binary oxides as studied by electrical scanning probe techniques
dc.typeProceedings paper
dc.contributor.imecauthorCelano, Umberto
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.source.peerreviewyes
dc.source.conference61st Electronic Materials Conference, EMC 2019
dc.source.conferencedate26/06/2019
dc.source.conferencelocationAnn Harbor, MI USA
imec.availabilityPublished - imec


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