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Nanoscale electrical characterization of low dimensional materials for electronics

dc.contributor.authorCelano, Umberto
dc.date.accessioned2021-10-27T07:54:04Z
dc.date.available2021-10-27T07:54:04Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32666
dc.sourceIIOimport
dc.titleNanoscale electrical characterization of low dimensional materials for electronics
dc.typeProceedings paper
dc.contributor.imecauthorCelano, Umberto
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.source.peerreviewno
dc.source.conference9th International Conference on Low Dimensional Structures and Devices
dc.source.conferencedate2/12/2019
dc.source.conferencelocationPuerto Varas Chile
dc.identifier.urlhttp://www.ldsd2019.org/invited-speakers/
imec.availabilityPublished - imec


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