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Understanding tip-induced nanoscale wear for tomographic atomic force microscopy

dc.contributor.authorCelano, Umberto
dc.contributor.authorXiaoli, Hu
dc.contributor.authorPandey, Komal
dc.contributor.authorWouters, Lennaert
dc.contributor.authorParedis, Kristof
dc.contributor.authorHantschel, Thomas
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorMartini, Ashlie
dc.date.accessioned2021-10-27T07:54:41Z
dc.date.available2021-10-27T07:54:41Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32669
dc.sourceIIOimport
dc.titleUnderstanding tip-induced nanoscale wear for tomographic atomic force microscopy
dc.typeMeeting abstract
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorPandey, Komal
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.source.peerreviewyes
dc.source.beginpageNS-ThP8
dc.source.conferenceAVS 66th International Symposium & Exhibition
dc.source.conferencedate20/10/2019
dc.source.conferencelocationColumbus, OH USA
dc.identifier.urlhttps://www2.avs.org/symposium2019/Papers/Paper_NS-ThP8.html
imec.availabilityPublished - imec


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